by Hwajung Kim, Inhwi Hwang, Jeongeun Lee, Heonyoung Yeom and Hanul Sung
Reference:
Concurrent and Robust End-to-End Data Integrity Verification Scheme for Flash-Based Storage Devices (Hwajung Kim, Inhwi Hwang, Jeongeun Lee, Heonyoung Yeom and Hanul Sung), In IEEE Access, volume 10, 2022.
Bibtex Entry:
@article{Access2022hwajung,
title = {Concurrent and Robust End-to-End Data Integrity Verification Scheme for Flash-Based Storage Devices},
journal = {IEEE Access},
volume = {10},
pages = {36350-36361},
year = {2022},
issn = {2169-3536},
doi = {10.1109/ACCESS.2022.3163729},
author = {Hwajung Kim and Inhwi Hwang and Jeongeun Lee and Heonyoung Yeom and Hanul Sung},
}